Description

MIL DESC 5962-95614 – MICROCIRCUIT, DIGITAL, ADVANED BIPOLAR CMSO, SCAN TEST DEVICE WITH 18-BIT UNIVERSAL, PLUS TRANCEIVER, THREE STATE OUTPUTS, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON

Product Details

Published:

10/13/1995

Number of Pages:

30

File Size:

1 file , 1.5 MB

Note:

This product is unavailable in Ukraine, Russia, Belarus