Description

MIL DESC 5962-91727 – MICROCIRCUIT, DIGITAL, BIPOLAR CMOS, SCAN TEST DEVICE WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOP, THREE-STATE OUTPUTS, MONOLITHIC SILICON

Product Details

Published:

01/14/1994

Number of Pages:

23

File Size:

1 file , 1.1 MB

Note:

This product is unavailable in Ukraine, Russia, Belarus