Description

JEDEC JESD51-6 – INTEGRATED CIRCUIT THERMAL TEST METHOD ENVIRONMENTAL CONDITIONS – FORCED CONVECTION (MOVING AIR)

This standard specifies the environmental conditions for determining thermal performance of an integrated circuit device in a forced convection environment when mounted on a standard thermal test board.

Product Details

Published:

03/01/1999

Number of Pages:

8

File Size:

1 file , 470 KB

Note:

This product is unavailable in Russia, Ukraine, Belarus