Description

JEDEC JESD51-1 – INTEGRATED CIRCUIT THERMAL MEASUREMENT METHOD – ELECTRICAL TEST METHOD (SINGLE SEMICONDUCTOR DEVICE)

The purpose of this test method is to define a standard Electrical Test Method (ETM) that can be used to determine the thermal characteristics of single integrated circuit devices housed in some form of electrical package. This method will provide a basis for comparison of different devices housed in the same electronic package or similar devices housed in different electronic packages.

Product Details

Published:

12/01/1995

Number of Pages:

36

File Size:

1 file , 560 KB

Note:

This product is unavailable in Russia, Ukraine, Belarus