Description

BS PD IEC TS 62876-2-1 – Nanotechnology. Reliability assessment

BS PD IEC TS 62876-2-1:2018, which is a Technical Specification, establishes a general stabilitytesting programme to verify the stability of the performance of nanomaterials and nanoenabledphotovoltaic devices (NePV) devices. These devices are used as subassemblies forthe fabrication of photovoltaic modules through a combination with other components. Thistesting programme defines standardized degradation conditions, methodologies and dataassessment for technologies. The results of these tests define a stability under standardizeddegradation conditions for quantitative evaluation of the stability of a new technology. Theprocedures outlined in this document were designed for NePV, but can be extended to serveas a guideline for other photovoltaic technologies as well.

Cross References:
ISO 4892-2:2013
IEC 60068-2-78
ISO 4892-1
ISO 877-1
ISO 9370
IEC 60904-9
IEC 60904-1
ISO/IEC 17025
IEC 60068-2-2
IEC 60721-2-1

All current amendments available at time of purchase are included with the purchase of this document.

Product Details

Published:

09/04/2018

ISBN(s):

9780580957413

Number of Pages:

32

File Size:

1 file , 1.1 MB

Product Code(s):

30348311, 30348311, 30348311

Note:

This product is unavailable in Ukraine, Russia, Belarus