Description

BS PD IEC/TR 63133 – Semiconductor devices. Scan based ageing level estimation for semiconductor devices

BS PD IEC/TR 63133:2017 specifies a design technique of performance estimation storageelement, which can monitor semiconductor ageing and characterize ageing level. Theestimated ageing level can be used to improve the reliability of system.

Cross References:
IEEE 1149.1:2013

All current amendments available at time of purchase are included with the purchase of this document.

Product Details

Published:

01/29/2018

ISBN(s):

9780580988516

Number of Pages:

20

File Size:

1 file , 1.4 MB

Product Code(s):

30361972, 30361972, 30361972

Note:

This product is unavailable in Ukraine, Russia, Belarus