Description

BS CECC 00013 – Harmonized system of quality assessment for electronic components: basic specification: scanning electron microscope inspection of semiconductor dice

Describes equipment and procedures to be used for SEM inspection of discrete semiconductor devices and integrated circuits.

Product Details

Published:

08/30/1985

ISBN(s):

0580146022

Number of Pages:

28

File Size:

1 file , 820 KB

Product Code(s):

00140153, 00140153, 00140153

Note:

This product is unavailable in Ukraine, Russia, Belarus