Description

AS IEC 61164 – Reliability growth – Statistical test and estimation methods

Adopts IEC 61164 Ed. 2.0 (2004) to describe the power law reliability growth model and related projection model, with step-by-step guidance on their use.

Product Details

Edition:

1st

Published:

01/01/2008

ISBN(s):

0733788408

Number of Pages:

49

File Size:

1 file , 1.8 MB

Product Code(s):

10085740, 10085719, 10085756

Note:

This product is unavailable in Ukraine, Russia, Belarus