JEDEC

Showing 46–60 of 419 results

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  GUIDELINE FOR ASSESSING THE CURRENT-CARRYING CAPABILITY OF THE LEADS IN A POWER PACKAGE SYSTEM

  Published by	Publication Date	Number of Pages
  JEDEC	02/01/2003	11

  JEDEC JEP145

  $53.00 Original price was: $53.00.$31.80Current price is: $31.80.

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  GUIDELINES FOR SUPPLIER PERFORMANCE RATING

  Published by	Publication Date	Number of Pages
  JEDEC	01/01/2009	20

  JEDEC JEP146A

  $60.00 Original price was: $60.00.$36.00Current price is: $36.00.

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  PROCEDURE FOR MEASURING INPUT CAPACITANCE USING A VECTOR NETWORK ANALYZER (VNA)

  Published by	Publication Date	Number of Pages
  JEDEC	10/01/2003	11

  JEDEC JEP147

  $53.00 Original price was: $53.00.$31.80Current price is: $31.80.

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  RELIABILITY QUALIFICATION OF SEMICONDUCTOR DEVICES BASED ON PHYSICS OF FAILURE RISK AND OPPORTUNITY ASSESSMENT

  Published by	Publication Date	Number of Pages
  JEDEC	01/01/2014	38

  JEDEC JEP148B

  $78.00 Original price was: $78.00.$46.80Current price is: $46.80.

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  APPLICATION THERMAL DERATING METHODOLOGIES

  Published by	Publication Date	Number of Pages
  JEDEC	11/01/2004	17

  JEDEC JEP149

  $59.00 Original price was: $59.00.$35.40Current price is: $35.40.

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  STRESS-TEST-DRIVEN QUALIFICATION OF AND FAILURE MECHANISMS ASSOCIATED WITH ASSEMBLED SOLID STATE SURFACE-MOUNT COMPONENTS

  Published by	Publication Date	Number of Pages
  JEDEC	06/01/2013	24

  JEDEC JEP150.01

  $67.00 Original price was: $67.00.$40.20Current price is: $40.20.

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  , Test Procedure for the Measurement of Terrestrial Cosmic Ray Induced Destructive Effects in Power Semiconductor Devices

  Published by	Publication Date	Number of Pages
  JEDEC	12/01/2015	24

  JEDEC JEP151

  $62.00 Original price was: $62.00.$37.20Current price is: $37.20.

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  DDR2 DIMM CLOCK SKEW MEASUREMENT PROCEDURE USING A CLOCK REFERENCE BOARD

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  JEDEC	05/01/2007	29

  JEDEC JEP152

  $72.00 Original price was: $72.00.$43.20Current price is: $43.20.

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  CHARACTERIZATION AND MONITORING OF THERMAL STRESS TEST OVEN TEMPURATURES

  Published by	Publication Date	Number of Pages
  JEDEC	03/01/2014	20

  JEDEC JEP153A

  $60.00 Original price was: $60.00.$36.00Current price is: $36.00.

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  GUIDELINE FOR CHARACTERIZING SOLDER BUMP ELECTROMIGRATION UNDER CONSTANT CURRENT AND TEMPERATURE STRESS

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  JEDEC	01/01/2008	34

  JEDEC JEP154

  $76.00 Original price was: $76.00.$45.60Current price is: $45.60.

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  RECOMMENDED ESD TARGET LEVELS FOR HBM QUALIFICATION

  Published by	Publication Date	Number of Pages
  JEDEC	07/01/2018	58

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  JEDEC JEP155B

  $91.00 Original price was: $91.00.$54.60Current price is: $54.60.

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  CHIP-PACKAGE INTERACTION UNDERSTANDING, IDENTIFICATION AND EVALUATION

  Published by	Publication Date	Number of Pages
  JEDEC	03/01/2018	24

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  JEDEC JEP156A

  $67.00 Original price was: $67.00.$40.20Current price is: $40.20.

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  Recommended ESD-CDM Target Levels

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  JEDEC	04/01/2022	174

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  JEDEC JEP157A

  $208.00 Original price was: $208.00.$124.80Current price is: $124.80.

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  3D Chip Stack with Through-Silicon Vias (TSVS): Identifying, Evaluating and Understanding Reliability Interactions

  Published by	Publication Date	Number of Pages
  JEDEC	11/01/2009	23

  JEDEC JEP158

  $62.00 Original price was: $62.00.$37.20Current price is: $37.20.

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  PROCEDURE FOR THE EVQLUQTION OF LOW-k/METAL INTER/INTRA-LEVEL DIELECTRIC INTEGRITY

  Published by	Publication Date	Number of Pages
  JEDEC	07/01/2015	30

  JEDEC JEP159A

  $74.00 Original price was: $74.00.$44.40Current price is: $44.40.

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