JEDEC

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  STANDARD METHOD FOR MEASURING AND USING THE TEMPERATURE COEFFICIENT OF RESISTANCE TO DETERMINE THE TEMPERATURE OF A METALLIZATION LINE

  Published by	Publication Date	Number of Pages
  JEDEC	02/01/2004	38

  JEDEC JESD33-B

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  STANDARD FOR THE MEASUREMENT OF CRE

  Published by	Publication Date	Number of Pages
  JEDEC	11/01/1967	13

  JEDEC JESD340 (R2009)

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  Lognormal Analysis of Uncensored Data, and of Singly Right-Censored Data Utilizing the Persson and Rootzen Method

  Published by	Publication Date	Number of Pages
  JEDEC	08/01/2017	36

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  JEDEC JESD37A

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  STANDARD FOR FAILURE ANALYSIS REPORT FORMAT

  Published by	Publication Date	Number of Pages
  JEDEC	12/01/1995	14

  JEDEC JESD38

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  MEASUREMENT OF SMALL VALUES OF TRANSISTOR CAPACITANCE

  Published by	Publication Date	Number of Pages
  JEDEC	07/01/1972	14

  JEDEC JESD398 (R2009)

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  DEFINITION OF EXTERNAL CLEARANCE AND CREEPAGE DISTANCES OF DISCRETE SEMICONDUCTOR PACKAGES FOR THYRISTORS AND RECTIFIER DIODES

  Published by	Publication Date	Number of Pages
  JEDEC	11/01/1983	8

  JEDEC JESD4 (R2002)

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  Temperature Range and Measurement Standards for Components and Module

  Published by	Publication Date	Number of Pages
  JEDEC	03/01/2022	22

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  JEDEC JESD402-1A

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  JEDEC Module Sideband Bus (SidebandBus)

  Published by	Publication Date	Number of Pages
  JEDEC	12/01/2021	60

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  JEDEC JESD403-1A

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  STANDARD LIST OF VALUES TO BE USED IN SEMICONDUCTOR DEVICE SPECIFICATIONS AND REGISTRATION FORMAT

  Published by	Publication Date	Number of Pages
  JEDEC	10/01/1980	7

  JEDEC JESD419-A (R2001)

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  CUSTOMER NOTIFICATION OF PRODUCT/PROCESS CHANGES BY ELECTRONIC PRODUCT SUPPLIERS

  Published by	Publication Date	Number of Pages
  JEDEC	n/a	14

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  JEDEC JESD46D

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  STRESS-TEST-DRIVEN QUALIFICATION OF INTEGRATED CIRCUITS

  Published by	Publication Date	Number of Pages
  JEDEC	08/01/2018	34

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  JEDEC JESD47K

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  PROCUREMENT STANDARD FOR KNOWN GOOD DIE (KGD)

  Published by	Publication Date	Number of Pages
  JEDEC	11/30/2020	20

  JEDEC JESD49B

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  SPECIAL REQUIREMENTS FOR MAVERICK PRODUCT ELIMINATION AND OUTLIER MANAGEMENT

  Published by	Publication Date	Number of Pages
  JEDEC	01/01/2018	20

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  JEDEC JESD50C

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  METHODOLOGY FOR THE THERMAL MEASUREMENT OF COMPONENT PACKAGES (SINGLE SEMICONDUCTOR DEVICE)

  Published by	Publication Date	Number of Pages
  JEDEC	12/01/1995	9

  JEDEC JESD51

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  INTEGRATED CIRCUIT THERMAL MEASUREMENT METHOD - ELECTRICAL TEST METHOD (SINGLE SEMICONDUCTOR DEVICE)

  Published by	Publication Date	Number of Pages
  JEDEC	12/01/1995	36

  JEDEC JESD51-1

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