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-40%Standard Test Method for Sheet Resistance of Silicon Epitaxial, Diffused, Polysilicon, and Ion-implanted Layers Using an In-Line Four-Point Probe with the Single-Configuration Procedure (Withdrawn 2003)
Published by Publication Date Number of Pages ASTM 12/10/2002 17 ASTM F374
Original price was: $65.00.$39.00Current price is: $39.00.