JEDEC

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  MEASUREMENT OF REVERSE RECOVERY TIME FOR SEMICONDUCTOR SIGNAL DIODES

  Published by	Publication Date	Number of Pages
  JEDEC	07/01/1996	18

  JEDEC EIA 318-B

  $59.00 Original price was: $59.00.$35.40Current price is: $35.40.

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  AIR-CONVECTION-COOLED, LIFE TEST ENVIRONMENT FOR LEAD-MOUNTED SEMICONDUCTOR DEVICES

  Published by	Publication Date	Number of Pages
  JEDEC	03/01/1966	9

  JEDEC EIA 323 (R2002)

  $51.00 Original price was: $51.00.$30.60Current price is: $30.60.

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  PERFORMANCE TEST PROCEDURE FOR SOLAR CELLS AND CALIBRATION PROCEDURE FOR SOLAR CELL STANDARDS FOR SPACE VEHICLE SERVICE

  Published by	Publication Date	Number of Pages
  JEDEC	11/01/1969	18

  JEDEC EIA 365 (R1984)

  $59.00 Original price was: $59.00.$35.40Current price is: $35.40.

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  RECOMMENDED STANDARD FOR THYRISTORS

  Published by	Publication Date	Number of Pages
  JEDEC	06/01/1972	192

  JEDEC EIA 397

  $228.00 Original price was: $228.00.$136.80Current price is: $136.80.

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  JOINT IPC/JEDEC STANDARD FOR MOISTURE/REFLOW SENSITIVITY CLASSIFICATION FOR NONHERMETIC SOLID STATE SURFACE-MOUNT DEVICES

  Published by	Publication Date	Number of Pages
  JEDEC	12/01/2014	24

  JEDEC J-STD-020E

  $75.00 Original price was: $75.00.$45.00Current price is: $45.00.

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  Handling, Packing, Shipping, and Use of Moisture/Reflow Sensitive Surface-Mount Devices

  Published by	Publication Date	Number of Pages
  JEDEC	04/01/2018	31

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  JEDEC J-STD-033D

  $89.00 Original price was: $89.00.$53.40Current price is: $53.40.

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  Handling, Packing, Shipping and Use of Moisture, Reflow, and Process Sensitive Devices

  Published by	Publication Date	Number of Pages
  JEDEC	04/01/2018	31

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  JEDEC J-STD-033D

  $79.00 Original price was: $79.00.$47.40Current price is: $47.40.

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  JOINT IPC/JEDEC STANDARD FOR ACOUSTIC MICROSCOPY FOR NONHERMETRIC ENCAPSULATED ELECTRONIC COMPONENTS

  Published by	Publication Date	Number of Pages
  JEDEC	05/01/1999	0

  JEDEC J-STD-035

  $35.00 Original price was: $35.00.$21.00Current price is: $21.00.

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  Notification Standard for Product Discontinuance

  Published by	Publication Date	Number of Pages
  JEDEC	11/01/2014	10

  JEDEC J-STD-048

  $51.00 Original price was: $51.00.$30.60Current price is: $30.60.

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  MARKING, SYMBOLS, AND LABELS OF LEADED AND LEAD-FREE TERMINAL FINISHED MATERIALS USED IN ELECTRONIC ASSEMBLY

  Published by	Publication Date	Number of Pages
  JEDEC	04/01/2016	24

  JEDEC J-STD-609B

  $62.00 Original price was: $62.00.$37.20Current price is: $37.20.

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  TERMINOLOGY AND METHODS OF MEASUREMENT FOR BISTABLE SEMICONDUCTOR MICROCIRCUITS

  Published by	Publication Date	Number of Pages
  JEDEC	11/01/1969	97

  JEDEC JEB 15

  $141.00 Original price was: $141.00.$84.60Current price is: $84.60.

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  RECOMMENDED CHARACTERIZATION OF MOS SHIFT REGISTERS

  Published by	Publication Date	Number of Pages
  JEDEC	11/01/1972	10

  JEDEC JEB 19

  $51.00 Original price was: $51.00.$30.60Current price is: $30.60.

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  METHODS OF MEASUREMENT FOR SEMICONDUCTOR LOGIC GATING MICROCIRCUITS

  Published by	Publication Date	Number of Pages
  JEDEC	01/01/1970	44

  JEDEC JEB 5-A (R1984)

  $80.00 Original price was: $80.00.$48.00Current price is: $48.00.

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  LIFE TEST METHODS FOR PHOTOCONDUCTIVE CELLS

  Published by	Publication Date	Number of Pages
  JEDEC	09/01/1969	25

  JEDEC JEP 79

  $67.00 Original price was: $67.00.$40.20Current price is: $40.20.

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  FOUNDRY PROCESS QUALIFICATION GUIDELINES - BACKEND OF LINE (Wafer Fabrication Manufacturing Sites)

  Published by	Publication Date	Number of Pages
  JEDEC	09/01/2018	26

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  JEDEC JEP001-1A

  $67.00 Original price was: $67.00.$40.20Current price is: $40.20.

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