ASTM
Showing 5131–5145 of 5387 results
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Sale!
-40%Standard Test Method for Thickness of Lightly Doped Silicon Epitaxial Layers on Heavily Doped Silicon Substrates Using an Infrared Dispersive Spectrophotometer (Withdrawn 2003)
Published by Publication Date Number of Pages ASTM 01/01/2000 7 ASTM F95
Original price was: $58.00.$34.80Current price is: $34.80. -
Sale!
-40%Standard Test Method for Measuring the Depth of Crystal Damage of a Mechanically Worked Silicon Slice Surface by Angle Polishing and Defect Etching (Withdrawn 2003)
Published by Publication Date Number of Pages ASTM 12/10/2002 6 ASTM F950
Original price was: $58.00.$34.80Current price is: $34.80.