ASTM
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-40%Standard Test Method for Measurement of Interstitial Oxygen Content of Silicon Wafers by Infrared Absorption Spectroscopy with p-Polarized Radiation Incident at the Brewster Angle (Withdrawn 2003)
Published by Publication Date Number of Pages ASTM 01/01/2000 7 ASTM F1619
Original price was: $58.00.$34.80Current price is: $34.80. -
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-40%Standard Practice for Calibrating a Scanning Surface Inspection System Using Monodisperse Polystyrene Latex Spheres Deposited on Polished or Epitaxial Wafer Surfaces (Withdrawn 2003)
Published by Publication Date Number of Pages ASTM 01/01/1996 6 ASTM F1620
Original price was: $62.00.$37.20Current price is: $37.20.