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-40%Standard Test Method for Carrier Recombination Lifetime in Silicon Wafers by Noncontact Measurement of Photoconductivity Decay by Microwave Reflectance (Withdrawn 2003)
Published by Publication Date Number of Pages ASTM 06/10/2000 12 ASTM F1535
Original price was: $65.00.$39.00Current price is: $39.00.