Description

ESD TR5.4-01 – Transient Induced Latch-Up (TLU)

This report provides a brief background on early latch-up work, reviews the issues surrounding the power supply response requirements, and discusses the efforts on RLC TLU testing, transmission line pulse (TLP) stressing, and the new bi-polar stress TLU methodology.

Product Details

Published:

2000

Number of Pages:

29

File Size:

1 file , 730 KB

Note:

This product is unavailable in Russia, Ukraine, Belarus